SPIE Optical Metrology in Munich

SPIE Optical Metrology, the premier European conference where scientists, engineers, researchers, and product developers gather to discuss the latest research in measurement systems, modeling, multimodal sensing, and inspection.

Topics: Optical Measurement Systems for Industrial Inspection • Modeling Aspects in Optical Metrology • Optical Methods for Inspection, Characterization, and Imaging of Biomaterials • Multimodal Sensing: Technologies and Applications • Automated Visual Inspection and Machine Vision • O3A: Optics for Arts, Architecture, and Archaeology