XTOP2020 — 15th Biennial Conference on High-Resolution X-Ray Diffraction and Imaging

XTOP 2020 – the 15th Biennial Conference on High-Resolution X-Ray Diffraction and Imaging – will take place in Minsk, Belarus, from 12th to 17th September 2021. XTOP is focused on various aspects of X-ray research, covering such fields as X-ray diffractometry, reflectometry, small angle X-ray scattering, stress and strain analysis, and different imaging techniques. The conference provides a scientific platform for researchers and engineers that helps to discover new developments in X-ray instrumentation, measurement techniques, analysis, and applications. Special attention is paid to the presentation of such up-to-date research area as experiments at synchrotrons and XFELs. Besides, XTOP demonstrates introduction of state-of-the-art approaches to analysis like artificial intelligence to solve the most challenging problems. For this purpose, the conference gathers outstanding experts worldwide for giving presentations.