Quantum surface metrology (ENG1449)

Quantum surface metrology

Supervised by: Dr Samanta Piano

There is an urgent need in materials science and manufacturing engineering to devise fast and accurate methods for surface metrology, able to resolve complex geometries, especially high-slope features at submicrometre scales. When measuring the topography of surfaces with complex geometry, the spacing of the points in an image must be considered, along with the ability to accurately determine the heights of features. In other words, the optical lateral resolution must be considered in conjunction with the ability of the system to transfer surface amplitudes. Preliminary studies have revealed that quantum detectors can efficiently resolve both the axial and angular separation of two point sources in sub-wavelength imaging, however, there remains a conceptual and technical gap to bring these ideas into fruition for actual surface reconstruction.

In this project the student will undertake a detailed analysis of a quantum surface measurement system by theoretically modelling a discrete grid of quantum dot emitters distributed on the surface of complex (virtual) objects, and a reconfigurable array of detectors feeding into a linear interferometer. The student will make use of prior information (the nominal design data) and regular Bayesian update methods to optimise the measurement setup, including optimising the configuration of the detectors and the aperture. This analysis will return an object surface reconstruction model plus uncertainties of that model as output (the posterior). These theoretical simulations will inform future designs for quantum-enhanced optical measuring instruments. 

The project will be supervised by Dr Samanta Piano, from the Manufacturing Metrology Team (MMT). MMT is an international and diverse team that thrives on openness and cooperation – students work in teams to achieve joint goals in a friendly but professional cohort.

The position is available for UK candidates, but EU or International applicants who can pay the difference between the Home and International Fees would also be welcome to apply.

Candidates must possess or expect to obtain, a high 2:1 or 1st class degree in science, engineering or computer science, or other relevant discipline.

How to Apply

If you are interested in pursuing this area of study as part of the Midlands Centre for Data-Driven Metrology Centre for Doctoral Training, please provide an expression of interest to Katie Blake (charlotte.blake1@nottingham.ac.uk) in the first instance. Competitive funding is available for high-quality candidates. Please include the title of the project you are interested in studying when contacting the team.

Closing Date: 03 May 2021
Category: Studentships