SPIE Optical Metrology, the premier European conference where scientists, engineers, researchers, and product developers gather to discuss the latest research in measurement systems, modeling, multimodal sensing, and inspection.
Topics: Optical Measurement Systems for Industrial Inspection • Modeling Aspects in Optical Metrology • Optical Methods for Inspection, Characterization, and Imaging of Biomaterials • Multimodal Sensing: Technologies and Applications • Automated Visual Inspection and Machine Vision • O3A: Optics for Arts, Architecture, and Archaeology