The FCMN will bring together scientists and engineers interested in all aspects of the characterization technology needed for nanoelectronic materials and device research, development, and manufacturing. All approaches are welcome: chemical, physical, electrical, magnetic, optical, in-situ, and real-time control and monitoring. The conference will summarize major issues and provided critical reviews of important semiconductor techniques needed as the semiconductor industry moves to silicon nanoelectronics and beyond.
FCMN — International Conference on Frontiers of Characterization and Metrology for Nanoelectronics to be held in Monterey, California, Estados Unidos between 02 abril 2019 and 04 abril 2019. It covers specific areas of Ciências da Engenharia such as 0. Visit the website of the conference for more detailed information or contact the organizer for specific questions.
Add to calendar2019-04-022019-04-04Europe/LondonFCMN — International Conference on Frontiers of Characterization and Metrology for Nanoelectronicshttps://www.sciencedz.net/pt/conference/49935-fcmn-international-conference-on-frontiers-of-characterization-and-metrology-for-nanoelectronicsMonterey, California - Estados Unidos
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