EM'2020 — XVIIth International Conference on Electron Microscopy

The XVIIth International Conference on Electron Microscopy (EM’2020), organised jointly by Silesian University of Technology and the Polish Society for Microscopy (PTMi), will provide a platform for electron microscopists, crystallographers, materials scientists, and solid state physicists to discuss methods and techniques used in electron microscopy. The scope of the EM’2020 is to provide a broad overview of the recent achievements in electron microscopy in the three major areas of instruments, methods, and application. The conference programme will include plenary lectures, oral and poster presentations covering both the fundamental, theory, instrumentations and applied research.

Topics: Sample preparation techniques; • Scanning electron microscopy (SEM); • Advances in SEM and FIB; • Transmission electron microscopy (TEM); • HREM and novel techniques; • In situ microscopy; • Electron diffraction and crystallography; • Electron backscatter diffraction