The conference will provide a forum for colleagues from both academia and industries throughout the world to exchange results and new ideas on Ion Beam Analysis and related techniques. The conference will cover advancements of scientific knowledge from fundamental understanding to new applications. Discussion on present possibilities and future developments of the technique, in view of the future requirements coming from technology and basic research, will be particularly solicited also with dedicated discussion sessions.
As in past conferences, the conference will also be preceded by one day of tutorials and a welcome reception.