Frontiers of Aberration-corrected Electron Microscopy is a series of biennial conferences focusing on fundamental electron optics and it's applications to advanced transmission electron microscopy techniques being applied to the study of solid state research phenomena and the life sciences. The conference series primarily arose to satisfy the requirements of the electron microscopy community working on solid state problems at the atomic scale, which grew explosively in the early 2000's with the introduction of aberration corrector units in commercial instruments and has expanded since to researchers working with analytical periphery, at low acceleration voltages or making use of various in-situ techniques.
Topics: advanced electron microscopy research